John D. Baniecki先生 富士通研究所
演題:「Charge relaxation at metal-dielectric interfaces: An evaluation of modeling approaches」
内容:In the talk I will give an overview of experimental evidence for charge storage and relaxation at metal-dielectric interfaces and evaluate various modeling approaches that have been used to interpret reliability phenomena such as imprint, in the case of ferroelectric thin film capacitors, and time dependent currents in the case of high dielectric thin films capacitors. Emphasis will be placed on comparing models based on Maxwell-Wagner relaxation due to charge storage and release at lower permittivity-higher permittivity interfaces near metal-dielectric contacts and a more realistic approach talking into account the kinetics of carrier exchange between traps in the vicinity of the metal-dielectric interface and carrier reservoirs. Applications to transient current phenomena will be explored.